Readspeaker menu


The research group is engaged in the research on nanostructures, surfaces, and thin films of both organic and inorganic semiconductor materials, with emphasize on 2D materials.

Our main research interest lays in the discovery of structure-property-relations of structurally well-defined ultrathin epitaxial layers, organic quantum wells, K-doped organic super conductors, and modern 2D materials (epitaxial graphene, transition metal dichalcogenides). The main target of our research is the development of basic principles for the use of optoelectronic nano materials in prospective devices.

Our in situ optical spectroscopy, namely differential reflectance spectroscopy (DRS), is used to study ultrathin films (effective film thickness down to 0.03 nm) organic (sub-)monolayers and heterostructures in terms of absorption spectroscopy to analyze the optical interaction between either the molecules itself, organic adsorbates and inorganic substrates, or molecules and dopants. For the analyses of the chemical composition and bonding at surfaces and in thin films we use surface analysis methods like photoelectron spectroscopy (XPS, ARUPS) and Auger electron spectroscopy (AES). The crystalline structure can be determined by electron diffraction (LEED, RHEED, XPD).  Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) at ultra-low temperatures (T = 1.1 K) are used for high-resolution imaging of nanostructures and surfaces.

The group has a network of theoretical and experimental collaborators in Germany, Austria, USA, and Japan.

>> link to the Fritz group

Border Bottom